IEEE - Institute of Electrical and Electronics Engineers, Inc. - Digital Signals in IEEE 1641 and ATML

2009 IEEE AUTOTESTCON

Author(s): Gorringe, C. ; Brown, M. ; Lopes, T.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2009
Conference Location: Anaheim, CA, USA, USA
Conference Date: 14 September 2009
Page(s): 305 - 310
ISBN (CD): 978-1-4244-4981-1
ISBN (Paper): 978-1-4244-4980-4
ISSN (Paper): 1088-7725
DOI: 10.1109/AUTEST.2009.5314018
Regular:

The paper discusses the rational and benefits behind the recent MoD demonstration, using a fully compliant IEEE 1641 test system for both digital and analogue test programs, in line with the MoD... View More

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