IEEE - Institute of Electrical and Electronics Engineers, Inc. - Managing the transition to IEEE 1641, via ATLAS based test systems

2009 IEEE AUTOTESTCON

Author(s): Hulme, A.M.B.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2009
Conference Location: Anaheim, CA, USA, USA
Conference Date: 14 September 2009
Page(s): 251 - 255
ISBN (CD): 978-1-4244-4981-1
ISBN (Paper): 978-1-4244-4980-4
ISSN (Paper): 1088-7725
DOI: 10.1109/AUTEST.2009.5314015
Regular:

Over the last two years, a product has been introduced onto a Royal Air Force test system, which provides an integrated IEEE 1641 development and run-time system. The program involved the... View More

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