IEEE - Institute of Electrical and Electronics Engineers, Inc. - PXI based flight-line test sets

2009 IEEE AUTOTESTCON

Author(s): Gutterman, L.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2009
Conference Location: Anaheim, CA, USA, USA
Conference Date: 14 September 2009
Page(s): 210 - 213
ISBN (CD): 978-1-4244-4981-1
ISBN (Paper): 978-1-4244-4980-4
ISSN (Paper): 1088-7725
DOI: 10.1109/AUTEST.2009.5314009
Regular:

In the past decade, PXI has proven to be a powerful and robust standard that is suitable for most Mil-Aero test applications. PXI-based testers are widely used today in engineering test stations,... View More

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