IEEE - Institute of Electrical and Electronics Engineers, Inc. - A hierarchical framework for fault propagation analysis in complex systems

2009 IEEE AUTOTESTCON

Author(s): Abbas, M. ; Vachtsevanos, G.J.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2009
Conference Location: Anaheim, CA, USA, USA
Conference Date: 14 September 2009
Page(s): 353 - 358
ISBN (CD): 978-1-4244-4981-1
ISBN (Paper): 978-1-4244-4980-4
ISSN (Paper): 1088-7725
DOI: 10.1109/AUTEST.2009.5314003
Regular:

In complex systems, there are few critical failure modes. Prognostic models are focused at predicting the evolution of those critical faults, assuming that other subsystems in the same system are... View More

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