IEEE - Institute of Electrical and Electronics Engineers, Inc. - Simplified metrics for evaluating designs for testability

2009 IEEE AUTOTESTCON

Author(s): Ungar, L.Y. ; Davidson, S.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2009
Conference Location: Anaheim, CA, USA, USA
Conference Date: 14 September 2009
Page(s): 293 - 298
ISBN (CD): 978-1-4244-4981-1
ISBN (Paper): 978-1-4244-4980-4
ISSN (Paper): 1088-7725
DOI: 10.1109/AUTEST.2009.5313996
Regular:

Design for Testability (DFT) evaluation is quite complex and circuit dependent. To simplify the analysis and to apply the methodology more generally to different circuit types and different levels... View More

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