IEEE - Institute of Electrical and Electronics Engineers, Inc. - Applications of neural networks for the power quality factors measurement - i.e. voltage fluctuations

2009 10th International Conference on Electrical Power Quality and Utilisation - (EPQU)

Author(s): Szlosek, M. ; Hanzelka, Z.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2009
Conference Location: Lodz, Poland, Poland
Conference Date: 15 September 2009
Page(s): 1 - 5
ISBN (CD): 978-1-4244-5172-2
ISBN (Paper): 978-1-4244-5171-5
ISSN (Paper): 2150-6655
DOI: 10.1109/EPQU.2009.5318836
Regular:

It can be shown, that many flickermeters do not yield credible output readings although the manufacturers declare their compliance with the requirements of standard IEC 61000-4-15 [4].... View More

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