IEEE - Institute of Electrical and Electronics Engineers, Inc. - Runtime Self-Diagnosis and Self-Recovery Infrastructure for Embedded Systems

2009 Third IEEE International Conference on Self-Adaptive and Self-Organizing Systems (SASO)

Author(s): Lei Sun ; Kinebuchi, Y. ; Katori, T. ; Nakajima, T.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2009
Conference Location: San Francisco, California, USA, USA
Conference Date: 14 September 2009
Page(s): 284 - 285
ISBN (CD): 978-0-7695-3794-8
ISBN (Paper): 978-1-4244-4890-6
DOI: 10.1109/SASO.2009.21
Regular:

In this paper, a runtime self-diagnosis and self-recovery infrastructure is presented for embedded systems. Different from existing methods of off-line tracing system logs, our research focuses on... View More

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