IEEE - Institute of Electrical and Electronics Engineers, Inc. - Discriminant random field and patch-based redundancy analysis for image change detection

2009 IEEE International Workshop on Machine Learning for Signal Processing (MLSP)

Author(s): Kervrann, C. ; Boulanger, J. ; Pecot, T. ; Perez, P.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2009
Conference Location: Grenoble, France, France
Conference Date: 1 September 2009
Page(s): 1 - 6
ISBN (CD): 978-1-4244-4948-4
ISBN (Paper): 978-1-4244-4947-7
ISSN (CD): 1551-2541
DOI: 10.1109/MLSP.2009.5306258
Regular:

To develop better image change detection algorithms, new models able to capture all the spatio-temporal regularities and geometries seen in an image pair are needed. In contrast to the usual... View More

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