IEEE - Institute of Electrical and Electronics Engineers, Inc. - On the (dis)similarity of transactional memory workloads

2009 IEEE International Symposium on Workload Characterization (IISWC)

Author(s): Hughes, C. ; Poe, J. ; Qouneh, A. ; Tao Li
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2009
Conference Location: Austin, TX, USA, USA
Conference Date: 4 October 2009
Page(s): 108 - 117
ISBN (CD): 978-1-4244-5157-2
ISBN (Paper): 978-1-4244-5156-2
DOI: 10.1109/IISWC.2009.5306790
Regular:

Programming to exploit the resources in a multicore system remains a major obstacle for both computer and software engineers. Transactional memory offers an attractive alternative to traditional... View More

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