IEEE - Institute of Electrical and Electronics Engineers, Inc. - Understanding the applicability of CMP performance optimizations on data mining applications

2009 IEEE International Symposium on Workload Characterization (IISWC)

Author(s): Jibaja, I. ; Shaw, K.A.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2009
Conference Location: Austin, TX, USA, USA
Conference Date: 4 October 2009
Page(s): 227 - 236
ISBN (CD): 978-1-4244-5157-2
ISBN (Paper): 978-1-4244-5156-2
DOI: 10.1109/IISWC.2009.5306779
Regular:

A major challenge to the creation of chip multiprocessors is designing the on-chip memory and communication resources to efficiently support parallel workloads. A variety of cache organizations,... View More

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