IEEE - Institute of Electrical and Electronics Engineers, Inc. - Estimation of affine transformations directly from tomographic projections

2009 6th International Symposium on Image and Signal Processing and Analysis

Author(s): R. Mooser ; E. Hack ; U. Sennhauser ; G. Szekely
Sponsor(s): IEEE
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2009
Conference Location: Salzburg, Austria
Conference Date: 16 September 2009
Page(s): 377 - 382
ISBN (CD): 978-953-184-134-4
ISBN (Paper): 978-953-184-135-1
ISSN (Paper): 1845-5921
DOI: 10.1109/ISPA.2009.5297700
Regular:

This paper presents a new approach to estimate affine transformations from tomographic projections. Instead of estimating the deformation from the reconstructed data, we introduce a method which... View More

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