IEEE - Institute of Electrical and Electronics Engineers, Inc. - Study on Project Risk Management in China

2009 Second International Conference on Intelligent Computation Technology and Automation (ICICTA)

Author(s): Fengsheng Li ; Li Wen ; Yingxue Li ; Yu Niu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2009
Conference Location: Changsha, Hunan, China, China
Conference Date: 10 October 2009
Volume: 4
Page(s): 442 - 445
ISBN (Paper): 978-0-7695-3804-4
DOI: 10.1109/ICICTA.2009.822
Regular:

In project selection, analysis and implementation of the entire process, internal and external interference factors, such as project risks, can not be predicted. If unchecked, the impact of risk... View More

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