IEEE - Institute of Electrical and Electronics Engineers, Inc. - Capability Evaluation for an Total Producing Process

2009 Second International Conference on Intelligent Computation Technology and Automation (ICICTA)

Author(s): Yihai He ; Wenbing Chang ; Weiping Mu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2009
Conference Location: Changsha, Hunan, China, China
Conference Date: 10 October 2009
Volume: 4
Page(s): 372 - 375
ISBN (Paper): 978-0-7695-3804-4
DOI: 10.1109/ICICTA.2009.804
Regular:

Process capability indices (PCIs) are powerful means of studying the process ability for manufacturing a product that meets specifications. However, available methods of Process Capability index... View More

Advertisement