IEEE - Institute of Electrical and Electronics Engineers, Inc. - Credit Risk Measurement of Chinese Listed Corporations Based on the KMV Model
2009 Second International Conference on Intelligent Computation Technology and Automation (ICICTA)
| Author(s): | Jingdi Wang ; Dongsheng Zhou ; Bailing Wang ; Xiaoling Feng |
| Publisher: | IEEE - Institute of Electrical and Electronics Engineers, Inc. |
| Publication Date: | 1 October 2009 |
| Conference Location: | Changsha, Hunan, China, China |
| Conference Date: | 10 October 2009 |
| Volume: | 4 |
| Page(s): | 168 - 171 |
| ISBN (Paper): | 978-0-7695-3804-4 |
| DOI: | 10.1109/ICICTA.2009.757 |
Regular:
Credit risk management has become a fundamental and crucial work for commercial banks. This paper studies the credit risk measurement of listed corporations by using various types of credit risk... View More
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