IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Fault Diagnosis Method Combining Rough Sets and Neural Network

2009 Second International Conference on Intelligent Computation Technology and Automation (ICICTA)

Author(s): Yang Jie
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2009
Conference Location: Changsha, Hunan, China, China
Conference Date: 10 October 2009
Volume: 2
Page(s): 483 - 486
ISBN (Paper): 978-0-7695-3804-4
DOI: 10.1109/ICICTA.2009.351
Regular:

Rough sets and neural networks are two common techniques applied to data mining problems in order to inprove diagnosis precision and decreasing misinformation diagnosis.Integrating the... View More

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