IEEE - Institute of Electrical and Electronics Engineers, Inc. - Reliability Growth Evaluation New Method for Gompertz Model Based on Bayesian Theory

2009 Second International Conference on Intelligent Computation Technology and Automation (ICICTA)

Author(s): Mao Zhao-yong ; Song Bao-wei
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2009
Conference Location: Changsha, Hunan, China, China
Conference Date: 10 October 2009
Volume: 2
Page(s): 556 - 559
ISBN (Paper): 978-0-7695-3804-4
DOI: 10.1109/ICICTA.2009.369
Regular:

The Bayesian method is adopted as an important and suitable approach to the small sample reliability analysis and evaluation, which can use all kinds of the system information. How to acquire... View More

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