IEEE - Institute of Electrical and Electronics Engineers, Inc. - Design of Control System of the Dial Gauge Automatic Test System

2009 Second International Conference on Intelligent Computation Technology and Automation (ICICTA)

Author(s): Yang Musheng ; Zhang Yu ; Wang Huilin
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2009
Conference Location: Changsha, Hunan, China, China
Conference Date: 10 October 2009
Volume: 1
Page(s): 778 - 781
ISBN (Paper): 978-0-7695-3804-4
DOI: 10.1109/ICICTA.2009.194
Regular:

The dial gauge is used widely in the production line at present. The dial gauge has many types and huge quantity. At present, testing this type of instrument is mainly used manual observation... View More

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