IEEE - Institute of Electrical and Electronics Engineers, Inc. - The effect of granularity level on software defect prediction

2009 24th International Symposium on Computer and Information Sciences (ISCIS)

Author(s): Calikli, G. ; Tosun, A. ; Bener, A. ; Celik, M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2009
Conference Location: Guzelyurt, Cyprus, Cyprus
Conference Date: 14 September 2009
Page(s): 531 - 536
ISBN (CD): 978-1-4244-5023-7
ISBN (Paper): 978-1-4244-5021-3
DOI: 10.1109/ISCIS.2009.5291866
Regular:

Application of defect predictors in software development helps the managers to allocate their resources such as time and effort more efficiently and cost effectively to test certain sections of... View More

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