IEEE - Institute of Electrical and Electronics Engineers, Inc. - Diagnostic of arbitrary geometry arrays via distributional approach

2009 European Wireless Technology Conference (EuWIT)

Author(s): Buonanno, A. ; D'Urso, M. ; Cicolani, M. ; Mosca, S.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2009
Conference Location: Rome, Italy, Italy
Conference Date: 28 September 2009
Page(s): 156 - 159
ISBN (Paper): 978-1-4244-4721-3
Regular:

A deterministic method for detecting faulty elements in large phased arrays of arbitrary geometry is proposed and tested against experimental data. The approach assumes as data the amplitude and... View More

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