IEEE - Institute of Electrical and Electronics Engineers, Inc. - Optimal Logic for Multi-Channel Protective Systems During On-Line Maintenance

Author(s): Takehisa Kohda ; Hiromitsu Kumamoto ; Koichi Inoue ; Ernest J. Henley
Sponsor(s): IEEE Reliability Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 1987
Volume: R-36
Page(s): 25 - 31
ISSN (Paper): 0018-9529
ISSN (Online): 1558-1721
DOI: 10.1109/TR.1987.5222287
Regular:

Protective systems have two kinds of failures: failed dangerous (FD) and failed-safe (FS). The former can lead to serious damage to the plant, while the latter can result in financial loss because... View More

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