IEEE - Institute of Electrical and Electronics Engineers, Inc. - Area Overhead Analysis of SEF: A Design Methodology for Tolerating SEU

Author(s): Yves Blaquiere ; Yvon Savaria
Sponsor(s): IEEE Nuclear and Plasma Sciences Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 1987
Volume: 34
Page(s): 1,481 - 1,486
ISSN (Paper): 0018-9499
ISSN (Online): 1558-1578
DOI: 10.1109/TNS.1987.4337503
Regular:

Soft-Error filtering (SEF) is a design methodology proposed recently [1,2] for implementing machines tolerant to SEU. This paper deals mainly with the evaluation and the reduction of the area... View More

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