IEEE - Institute of Electrical and Electronics Engineers, Inc. - SEU Measurements Using 252Cf Fission Particles, on CMOS Static RAMs, Subjected to a Continuous Period of Low Dose Rate 60Co Irradiation

Author(s): T. K. Sanderson ; D. Mapper ; J. H. Stephen ; J. Farren ; L. Adams ; R. Harboe-Sorensen
Sponsor(s): IEEE Nuclear and Plasma Sciences Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 1987
Volume: 34
Page(s): 1,287 - 1,291
ISSN (Paper): 0018-9499
ISSN (Online): 1558-1578
DOI: 10.1109/TNS.1987.4337467
Regular:

SEU measurements have been made on a number of CMOS static RAMs over a period of eight months while they were being continuously irradiated with 60 Co gamma rays. The results are discussed and... View More

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