IEEE - Institute of Electrical and Electronics Engineers, Inc. - Failure modes and failure analysis of white LEDs

2009 9th International Conference on Electronic Measurement & Instruments (ICEMI)

Author(s): Fugen Wu ; Wei Zhao ; Shaohua Yang ; Chunhua Zhang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2009
Conference Location: Beijing, China, China
Conference Date: 16 August 2009
ISBN (CD): 978-1-4244-3864-8
ISBN (Paper): 978-1-4244-3863-1
DOI: 10.1109/ICEMI.2009.5274756
Regular:

Reliability is one of primarily considered problems in white LED application. In this presentation, main failure modes in white LEDs such as ohmic contact degradation, electrode bonding defect,... View More

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