IEEE - Institute of Electrical and Electronics Engineers, Inc. - A model based on information entropy to measure developer turnover risk on software project

2009 2nd IEEE International Conference on Computer Science and Information Technology (ICCSIT 2009)

Author(s): Jiang Rong ; Liao Hongzhi ; Yu Jiankun ; Feng Tao ; Zhao Chenggui ; Li Junlin
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2009
Conference Location: Beijing, China, China
Conference Date: 8 August 2009
Page(s): 419 - 422
ISBN (CD): 978-1-4244-4520-2
ISBN (Paper): 978-1-4244-4519-6
DOI: 10.1109/ICCSIT.2009.5234813
Regular:

Risk can conduce to failure of software project, and make a loss for the enterprise. It is a focus topic for software engineering researchers. Developer turnover risk is a great risk at the... View More

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