IEEE - Institute of Electrical and Electronics Engineers, Inc. - The Realization of Remote On-line Testing for EPON

2009 WASE International Conference on Information Engineering (ICIE)

Author(s): Chen Wei ; Ren Bin ; Lai Shuming
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2009
Conference Location: Taiyuan, Shanxi, China, China
Conference Date: 10 July 2009
Volume: 2
Page(s): 429 - 432
ISBN (Paper): 978-0-7695-3679-8
DOI: 10.1109/ICIE.2009.277
Regular:

It is urgently necessary to accomplish the maintenance and testing for EPON system. Based on the analysis of related parts in IEEE802.3-2005, the paper introduces the realization of remote on-line... View More

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