IEEE - Institute of Electrical and Electronics Engineers, Inc. - Analysis and control of dimensional precision in turning process

2009 Chinese Control and Decision Conference (CCDC)

Author(s): Xuefeng Bi ; Yongxian Liu ; Yang Liu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2009
Conference Location: Guilin, China, China
Conference Date: 17 June 2009
Page(s): 3,456 - 3,459
ISBN (CD): 978-1-4244-2723-9
ISBN (Paper): 978-1-4244-2722-2
DOI: 10.1109/CCDC.2009.5192313
Regular:

The aim of the present work is to evaluate dimensional precision in turning process. A new model of dimensional error taking into account of flank wear and spring back of machined surface of... View More

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