IEEE - Institute of Electrical and Electronics Engineers, Inc. - Fault detection in IP-based process control networks using data mining

2009 IFIP/IEEE International Symposium on Integrated Network Management (IM)

Author(s): Byungchul Park ; Won, Y.J. ; Hwanjo Yu ; Hong, J.W.-K. ; Hong-Sun Noh ; Jang Jin Lee
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2009
Conference Location: New York, NY, USA, USA
Conference Date: 1 June 2009
Page(s): 211 - 217
ISBN (CD): 978-1-4244-3487-9
ISBN (Paper): 978-1-4244-3486-2
DOI: 10.1109/INM.2009.5188812
Regular:

Industrial process control IP networks support communications between process control applications and devices. Communication faults in any stage of these control networks can cause delays or even... View More

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