IEEE - Institute of Electrical and Electronics Engineers, Inc. - Effects of tip's shape on the beam loading of a cavity

2009 IEEE International Vacuum Electronics Conference (IVEC)

Author(s): Yamin Quan ; Yaogen Ding ; Shuzhong Wang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2009
Conference Location: Rome, Italy, Italy
Conference Date: 28 April 2009
Page(s): 213 - 214
ISBN (CD): 978-1-4244-3501-2
ISBN (Paper): 978-1-4244-3500-5
DOI: 10.1109/IVELEC.2009.5193489
Regular:

The effects of nose-cone shape and beam radius on the beam admittance are studied using PIC code and the results are compared with small signal theory calculation results.

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