IEEE - Institute of Electrical and Electronics Engineers, Inc. - Analysis of the beam-loading conductance in three-gap coupled cavity

2009 IEEE International Vacuum Electronics Conference (IVEC)

Author(s): Jing Ma ; Yong Wang ; Shuzhong Wang ; Yamin Quan ; Huipeng Han
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2009
Conference Location: Rome, Italy, Italy
Conference Date: 28 April 2009
Page(s): 147 - 148
ISBN (CD): 978-1-4244-3501-2
ISBN (Paper): 978-1-4244-3500-5
DOI: 10.1109/IVELEC.2009.5193479
Regular:

As trapped higher-order modes can possibly cause self-oscillations of three-gap coupled cavity, which may be a crucial influence on EIK's operation and performance, of great importance is analysis... View More

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