IEEE - Institute of Electrical and Electronics Engineers, Inc. - Analysis of thermal interface resistivity of a helix TWT slow-wave structure

2009 IEEE International Vacuum Electronics Conference (IVEC)

Author(s): Yong Han ; Yan-Wen Liu ; Yao-Gen Ding ; Pu-Kun Liu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2009
Conference Location: Rome, Italy, Italy
Conference Date: 28 April 2009
Page(s): 114 - 115
ISBN (CD): 978-1-4244-3501-2
ISBN (Paper): 978-1-4244-3500-5
DOI: 10.1109/IVELEC.2009.5193384
Regular:

The thermal interface resistivity (TIR) of the helix slow-wave structure (SWS) is studied theoretically and experimentally. The effects of the TIRs at different interfaces on heat dissipation... View More

Advertisement