IEEE - Institute of Electrical and Electronics Engineers, Inc. - Experimental, numerical and analytical studies of the staggered double vane structure for THz application

2009 IEEE International Vacuum Electronics Conference (IVEC)

Author(s): Young-Min Shin ; Barnett, L.R. ; Luhmann, N.C.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2009
Conference Location: Rome, Italy, Italy
Conference Date: 28 April 2009
Page(s): 106 - 107
ISBN (CD): 978-1-4244-3501-2
ISBN (Paper): 978-1-4244-3500-5
DOI: 10.1109/IVELEC.2009.5193375
Regular:

In our prior work, PIC simulation analysis predicted that half-period-staggered (HPSed) double grating arrays, the so-called "Barnett-Shin (BS) circuit", can produce a few hundred watts at... View More

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