IEEE - Institute of Electrical and Electronics Engineers, Inc. - Method for determining selective capability of current-limiting overcurrent devices using peak-let-through current “What traditional time current curves will not tell you”

2009 55th IEEEl Pulp and Paper Industry Technical Conference (PPIC)

Author(s): Valdes, M. ; Crabtree, A. ; Papallo, T.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2009
Conference Location: Birmingham, AL, USA, USA
Conference Date: 21 June 2009
Page(s): 145 - 153
ISBN (CD): 978-1-4244-3466-4
ISBN (Paper): 978-1-4244-3464-0
ISSN (Paper): 0190-2172
DOI: 10.1109/PAPCON.2009.5185424
Regular:

Time-Current-Curves are accepted industry standard for predicting overcurrent device operation and analyzing selective behavior under overload, or fault conditions. A conservative interpretation... View More

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