IEEE - Institute of Electrical and Electronics Engineers, Inc. - A cross-layer approach to heterogeneity and reliability

2009 7th IEEE/ACM International Conference on Formal Methods and Models for Co-Design (MEMOCODE)

Author(s): Williams, Daniel ; Sanyal, Aprotim ; Upton, Dan ; Mars, Jason ; Ghosh, Sudeep ; Hazelwood, Kim
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2009
Conference Location: Cambridge, MA, USA, USA
Conference Date: 13 July 2009
Page(s): 88 - 97
ISBN (Paper): 978-1-4244-4806-7
DOI: 10.1109/MEMCOD.2009.5185384
Regular:

As modern hardware becomes increasingly complex, it becomes more difficult to create efficient software for common computing workloads. One way to manage this complexity is to employ holistic... View More

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