IEEE - Institute of Electrical and Electronics Engineers, Inc. - A reusable coverage-driven verification environment for Network-on-Chip communication in embedded system platforms

2009 Seventh Workshop on Intelligent solutions in Embedded Systems (WISES 2009)

Author(s): Vitullo, F. ; Saponara, S. ; Petri, E. ; Casula, M. ; Fanucci, L. ; Maruccia, G. ; Locatelli, R. ; Coppola, M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2009
Conference Location: Ancona, Italy, Italy
Conference Date: 25 June 2009
Page(s): 71 - 77
ISBN (CD): 978-88-87548-02-0
ISBN (Paper): 978-1-4244-4838-8
Regular:

Functional verification plays an important role in the design flow of an Intellectual Property (IP) core and, in general, of an embedded system. The industrial trend of the last two decades has... View More

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