IEEE - Institute of Electrical and Electronics Engineers, Inc. - Critical Path Selection for Delay Test Considering Coupling Noise

2009 14th IEEE European Test Symposium (ETS)

Author(s): Tayade, R. ; Abraham, J.A.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2009
Conference Location: Sevilla, Spain, Spain
Conference Date: 25 May 2009
Page(s): 163 - 168
ISBN (Paper): 978-0-7695-3703-0
ISSN (Paper): 1530-1877
DOI: 10.1109/ETS.2009.37
Regular:

Identifying the set of real critical paths of a circuit is an important step in delay testing. Since path delays are vector dependent, the set of critical paths selected depends on the vectors... View More

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