IEEE - Institute of Electrical and Electronics Engineers, Inc. - Partial Scan Approach for Secret Information Protection

2009 14th IEEE European Test Symposium (ETS)

Author(s): Inoue, M. ; Yoneda, T. ; Hasegawa, M. ; Fujiwara, H.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2009
Conference Location: Sevilla, Spain, Spain
Conference Date: 25 May 2009
Page(s): 143 - 148
ISBN (Paper): 978-0-7695-3703-0
ISSN (Paper): 1530-1877
DOI: 10.1109/ETS.2009.15
Regular:

This paper proposes a secure scan design method whichprotects the circuits containing secret information such ascryptographic circuits from scan-based side channel attacks.The proposed method... View More

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