IEEE - Institute of Electrical and Electronics Engineers, Inc. - Increasing Robustness of SAT-based Delay Test Generation Using Efficient Dynamic Learning Techniques

2009 14th IEEE European Test Symposium (ETS)

Author(s): Eggersgluss, S. ; Drechsler, R.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2009
Conference Location: Sevilla, Spain, Spain
Conference Date: 25 May 2009
Page(s): 81 - 86
ISBN (Paper): 978-0-7695-3703-0
ISSN (Paper): 1530-1877
DOI: 10.1109/ETS.2009.13
Regular:

Due to the increased speed in modern designs, testing for delay faults has become an important issue in the post-production test of manufactured chips. A high fault coverage is needed to guarantee... View More

Advertisement