IEEE - Institute of Electrical and Electronics Engineers, Inc. - Algorithms for ADC Multi-site Test with Digital Input Stimulus

2009 14th IEEE European Test Symposium (ETS)

Author(s): Xiaoqin Sheng ; Kerkhoff, H. ; Zjajo, A. ; Gronthoud, G.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2009
Conference Location: Sevilla, Spain, Spain
Conference Date: 25 May 2009
Page(s): 45 - 50
ISBN (Paper): 978-0-7695-3703-0
ISSN (Paper): 1530-1877
DOI: 10.1109/ETS.2009.17
Regular:

This paper reports two novel algorithms based on time-modulo reconstruction method intended for detection of the parametric faults in analogue-to-digital converters (ADC). In both algorithms, a... View More

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