IEEE - Institute of Electrical and Electronics Engineers, Inc. - Speed-Path Debug Using At-Speed Scan Test Patterns

2009 14th IEEE European Test Symposium (ETS)

Author(s): Ruifeng Guo ; Wu-Tung Cheng ; Kun-Han Tsai
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2009
Conference Location: Sevilla, Spain, Spain
Conference Date: 25 May 2009
Page(s): 11 - 16
ISBN (Paper): 978-0-7695-3703-0
ISSN (Paper): 1530-1877
DOI: 10.1109/ETS.2009.12
Regular:

Speed path debug is a critical step to improve the performance of high performance VLSI designs. The purpose of speed path debug is to identify the performance limiting paths and fix them in the... View More

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