IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Framework for Modeling Impact of Intrinsic Parameter Fluctuations at Architectural-Level

2009 International Conference on Signal Processing Systems (ICSPS)

Author(s): Ahmed, R.A. ; Samsudin, K. ; Rokhani, F.Z.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2009
Conference Location: Singapore, Singapore
Conference Date: 15 May 2009
Page(s): 574 - 577
ISBN (Paper): 978-0-7695-3654-5
DOI: 10.1109/ICSPS.2009.89
Regular:

Abstract--- As the semiconductor process technology continues to scale deeper into the nanometer region, the intrinsic parameter fluctuations will aggressively affect the performance of future... View More

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