IEEE - Institute of Electrical and Electronics Engineers, Inc. - Wear Particle Profile Analysis

2009 International Conference on Signal Processing Systems (ICSPS)

Author(s): Laghari, M.S. ; Ahmed, F.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2009
Conference Location: Singapore, Singapore
Conference Date: 15 May 2009
Page(s): 546 - 550
ISBN (Paper): 978-0-7695-3654-5
DOI: 10.1109/ICSPS.2009.152
Regular:

Microscopic size wear debris transported through oil-lubricated systems provides important information about the condition of machinery, in particular the state of wear. Experts extract this... View More

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