IEEE - Institute of Electrical and Electronics Engineers, Inc. - The Effect of the Common Process Noise on the Two-Sensor Fused-Track Covariance

Author(s): Yaakov Bar-Shalom ; Leon Campo
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 1986
Volume: AES-22
Page(s): 803 - 805
ISSN (Paper): 0018-9251
DOI: 10.1109/TAES.1986.310815
Regular:

This note deals with the effect of the common process noise on the fusion (combination) of the state estimates of a target based on measurements obtained by two different sensors. This problem... View More

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