IEEE - Institute of Electrical and Electronics Engineers, Inc. - Correlation of soft error rates between mono-energetic and full spectrum beams on a 90nm SRAM technology

2009 IEEE International Reliability Physics Symposium (IRPS)

Author(s): Patel, N.B. ; Puchner, H.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2009
Conference Location: Montreal, QC, Canada, Canada
Conference Date: 26 April 2009
Page(s): 948 - 951
ISBN (CD): 978-1-4244-2889-2
ISBN (Paper): 978-1-4244-2888-5
ISSN (Paper): 1541-7026
DOI: 10.1109/IRPS.2009.5173386
Regular:

Mono-energetic beams and full spectrum beams have been used for years to calculate the soft error rates of SRAM devices. Each beam type offers advantages and disadvantages, but availability is one... View More

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