IEEE - Institute of Electrical and Electronics Engineers, Inc. - A statistical model of erratic erase based on an automated random telegraph signal characterization technique

2009 IEEE International Reliability Physics Symposium (IRPS)

Author(s): Chimenton, A. ; Zambelli, C. ; Olivo, P.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2009
Conference Location: Montreal, QC, Canada, Canada
Conference Date: 26 April 2009
Page(s): 896 - 901
ISBN (CD): 978-1-4244-2889-2
ISBN (Paper): 978-1-4244-2888-5
ISSN (Paper): 1541-7026
DOI: 10.1109/IRPS.2009.5173375
Regular:

We propose a new statistical model of the erratic erase based on a new RTS analysis technique. The experimental analysis revealed new interesting features of the erratic erase phenomenon. The... View More

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