IEEE - Institute of Electrical and Electronics Engineers, Inc. - Improved integrated circuits qualification using Dynamic Laser Stimulation techniques

2009 IEEE International Reliability Physics Symposium (IRPS)

Author(s): Deyine, A. ; Sanchez, K. ; Perdu, P. ; Battistella, F. ; Lewis, D.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2009
Conference Location: Montreal, QC, Canada, Canada
Conference Date: 26 April 2009
Page(s): 260 - 265
ISBN (CD): 978-1-4244-2889-2
ISBN (Paper): 978-1-4244-2888-5
ISSN (Paper): 1541-7026
DOI: 10.1109/IRPS.2009.5173260
Regular:

Dynamic Laser Stimulation techniques have been developed with success for failure analysis of integrated circuit subjected to "Soft Defect". Weakness in design and physical defect can be isolated... View More

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