IEEE - Institute of Electrical and Electronics Engineers, Inc. - An industrial fault injection platform for soft-error dependability analysis and hardening of complex system-on-a-chip

2009 IEEE International Reliability Physics Symposium (IRPS)

Author(s): Daveau, J.-M. ; Blampey, A. ; Gasiot, G. ; Bulone, J. ; Roche, P.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2009
Conference Location: Montreal, QC, Canada, Canada
Conference Date: 26 April 2009
Page(s): 212 - 220
ISBN (CD): 978-1-4244-2889-2
ISBN (Paper): 978-1-4244-2888-5
ISSN (Paper): 1541-7026
DOI: 10.1109/IRPS.2009.5173253
Regular:

This paper presents a fault injection platform that is currently developed and used to perform soft-error dependability analysis and hardening of complex SoCs1. Primarily, it is... View More

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