IEEE - Institute of Electrical and Electronics Engineers, Inc. - NSEU impact on commercial avionics

2009 IEEE International Reliability Physics Symposium (IRPS)

Author(s): Matthews, D.C. ; Dion, M.J.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2009
Conference Location: Montreal, QC, Canada, Canada
Conference Date: 26 April 2009
Page(s): 181 - 193
ISBN (CD): 978-1-4244-2889-2
ISBN (Paper): 978-1-4244-2888-5
ISSN (Paper): 1541-7026
DOI: 10.1109/IRPS.2009.5173249
Regular:

Neutron Single Event Upsets (NSEU) are known to have a significant impact on modern IC's used in typical ground applications. The impact is orders of magnitude more frequent and critical when IC's... View More

Advertisement