IEEE - Institute of Electrical and Electronics Engineers, Inc. - Reliability issues in AlGaN based deep ultraviolet light emitting diodes

2009 IEEE International Reliability Physics Symposium (IRPS)

Author(s): Khan, A. ; Seongmo Hwang ; Lowder, J. ; Adivarahan, V. ; Fareed, Q.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2009
Conference Location: Montreal, QC, Canada, Canada
Conference Date: 26 April 2009
Page(s): 89 - 93
ISBN (CD): 978-1-4244-2889-2
ISBN (Paper): 978-1-4244-2888-5
ISSN (Paper): 1541-7026
DOI: 10.1109/IRPS.2009.5173229
Regular:

AlGaN based deep ultraviolet light emitting diodes (DUV LEDs) are key components in systems for air, water, and food purification and germicidal applications. Because of the heteroepitaxial growth... View More

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