IEEE - Institute of Electrical and Electronics Engineers, Inc. - Ions on a needle's tip - Traps with enhanced optical and physical access

2009 Conference on Lasers & Electro-Optics Europe & 11th European Quantum Electronics Conference (CLEO/EQEC)

Author(s): Maiwald, R. ; Leibfried, D. ; Britton, J. ; Bergquist, J.C. ; Leuchs, G. ; Wineland, D.J.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2009
Conference Location: Munich, Germany, Germany
Conference Date: 14 June 2009
Page(s): 1
ISBN (CD): 978-1-4244-4080-1
ISBN (Paper): 978-1-4244-4079-5
DOI: 10.1109/CLEOE-EQEC.2009.5192303
Regular:

The properties of single atomic ions allow them to be used as sensitive probes to measure a multitude of physical effects, ranging from light field distributions to weak force fields, for example... View More

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