IEEE - Institute of Electrical and Electronics Engineers, Inc. - An edge matching technique for non-planar face intersections in geometric parametric models

2009 IEEE International Conference on Shape Modeling and Applications (SMI)

Author(s): Baba-ali, M. ; Marcheix, D. ; Skapin, X.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2009
Conference Location: Beijing, China, China
Conference Date: 26 June 2009
Page(s): 201 - 208
ISBN (CD): 978-1-4244-4070-2
ISBN (Paper): 978-1-4244-4069-6
DOI: 10.1109/SMI.2009.5170149
Regular:

In current feature-based parametric design systems the reusability principle is not as fully supported as it should be. Both unpredictability and ambiguity of models often happen during design... View More

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